Sidewall Voltage Equivalence Factor Solution

STEP 0: Pre-Calculation Summary
Formula Used
Sidewall Voltage Equivalence Factor = -(2*sqrt(Built in Potential of Sidewall Junctions)/(Final Voltage-Initial Voltage)*(sqrt(Built in Potential of Sidewall Junctions-Final Voltage)-sqrt(Built in Potential of Sidewall Junctions-Initial Voltage)))
Keq(sw) = -(2*sqrt(Φosw)/(V2-V1)*(sqrt(Φosw-V2)-sqrt(Φosw-V1)))
This formula uses 1 Functions, 4 Variables
Functions Used
sqrt - A square root function is a function that takes a non-negative number as an input and returns the square root of the given input number., sqrt(Number)
Variables Used
Sidewall Voltage Equivalence Factor - Sidewall Voltage Equivalence Factor represents the relationship between the voltage applied to a semiconductor device and the resulting change in sidewall junction capacitance per unit area.
Built in Potential of Sidewall Junctions - (Measured in Volt) - Built in Potential of Sidewall Junctions refers to the junction formed along the vertical or sidewall surfaces of the transistor structure.
Final Voltage - (Measured in Volt) - Final Voltage refers to the voltage level achieved or measured at the conclusion of a particular process or event.
Initial Voltage - (Measured in Volt) - Initial Voltage refer to the voltage present at a specific point in a circuit at the beginning of a certain operation or under specific conditions.
STEP 1: Convert Input(s) to Base Unit
Built in Potential of Sidewall Junctions: 3.2E-05 Volt --> 3.2E-05 Volt No Conversion Required
Final Voltage: 6.135 Nanovolt --> 6.135E-09 Volt (Check conversion ​here)
Initial Voltage: 5.42 Nanovolt --> 5.42E-09 Volt (Check conversion ​here)
STEP 2: Evaluate Formula
Substituting Input Values in Formula
Keq(sw) = -(2*sqrt(Φosw)/(V2-V1)*(sqrt(Φosw-V2)-sqrt(Φosw-V1))) --> -(2*sqrt(3.2E-05)/(6.135E-09-5.42E-09)*(sqrt(3.2E-05-6.135E-09)-sqrt(3.2E-05-5.42E-09)))
Evaluating ... ...
Keq(sw) = 1.00009028568687
STEP 3: Convert Result to Output's Unit
1.00009028568687 --> No Conversion Required
FINAL ANSWER
1.00009028568687 1.00009 <-- Sidewall Voltage Equivalence Factor
(Calculation completed in 00.004 seconds)

Credits

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Dayananda Sagar College of Engineering (DSCE), Bangalore
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Heritage Insitute of technology (HITK), Kolkata
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21 MOS Transistor Calculators

Sidewall Voltage Equivalence Factor
​ Go Sidewall Voltage Equivalence Factor = -(2*sqrt(Built in Potential of Sidewall Junctions)/(Final Voltage-Initial Voltage)*(sqrt(Built in Potential of Sidewall Junctions-Final Voltage)-sqrt(Built in Potential of Sidewall Junctions-Initial Voltage)))
Pull down Current in Linear Region
​ Go Linear Region Pull Down Current = sum(x,0,Number of Parallel Driver Transistors,(Electron Mobility*Oxide Capacitance/2)*(Channel Width/Channel Length)*(2*(Gate Source Voltage-Threshold Voltage)*Output Voltage-Output Voltage^2))
Node Voltage at Given Instance
​ Go Node Voltage at Given Instance = (Transconductance Factor/Node Capacitance)*int(exp(-(1/(Node Resistance*Node Capacitance))*(Time Period-x))*Current Flowing into Node*x,x,0,Time Period)
Pull down Current in Saturation Region
​ Go Saturation Region Pull Down Current = sum(x,0,Number of Parallel Driver Transistors,(Electron Mobility*Oxide Capacitance/2)*(Channel Width/Channel Length)*(Gate Source Voltage-Threshold Voltage)^2)
Saturation Time
​ Go Saturation Time = -2*Load Capacitance/(Transconductance Process Parameter*(High Output Voltage-Threshold Voltage)^2)*int(1,x,High Output Voltage,High Output Voltage-Threshold Voltage)
Drain Current Flowing through MOS Transistor
​ Go Drain Current = (Channel Width/Channel Length)*Electron Mobility*Oxide Capacitance*int((Gate Source Voltage-x-Threshold Voltage),x,0,Drain Source Voltage)
Time Delay when NMOS Operates in Linear Region
​ Go Linear Region in Time Delay = -2*Junction Capacitance*int(1/(Transconductance Process Parameter*(2*(Input Voltage-Threshold Voltage)*x-x^2)),x,Initial Voltage,Final Voltage)
Depletion Region Charge Density
​ Go Density of Depletion Layer Charge = (sqrt(2*[Charge-e]*[Permitivity-silicon]*Doping Concentration of Acceptor*modulus(Surface Potential-Bulk Fermi Potential)))
Depth of Depletion Region Associated with Drain
​ Go Drain's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*(Built in Junction Potential+Drain Source Voltage))/([Charge-e]*Doping Concentration of Acceptor))
Drain Current in Saturation Region in MOS Transistor
​ Go Saturation Region Drain Current = Channel Width*Saturation Electron Drift Velocity*int(Charge*Short Channel Parameter,x,0,Effective Channel Length)
Fermi Potential for P Type
​ Go Fermi Potential for P Type = ([BoltZ]*Absolute Temperature)/[Charge-e]*ln(Intrinsic Carrier Concentration/Doping Concentration of Acceptor)
Maximum Depletion Depth
​ Go Maximum Depletion Depth = sqrt((2*[Permitivity-silicon]*modulus(2*Bulk Fermi Potential))/([Charge-e]*Doping Concentration of Acceptor))
Fermi Potential for N Type
​ Go Fermi Potential for N Type = ([BoltZ]*Absolute Temperature)/[Charge-e]*ln(Donor Dopant Concentration/Intrinsic Carrier Concentration)
Equivalent Large Signal Capacitance
​ Go Equivalent Large Signal Capacitance = (1/(Final Voltage-Initial Voltage))*int(Junction Capacitance*x,x,Initial Voltage,Final Voltage)
Built in Potential at Depletion Region
​ Go Built in Voltage = -(sqrt(2*[Charge-e]*[Permitivity-silicon]*Doping Concentration of Acceptor*modulus(-2*Bulk Fermi Potential)))
Depth of Depletion Region Associated with Source
​ Go Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor))
Substrate Bias Coefficient
​ Go Substrate Bias Coefficient = sqrt(2*[Charge-e]*[Permitivity-silicon]*Doping Concentration of Acceptor)/Oxide Capacitance
Average Power Dissipated over Period of Time
​ Go Average Power = (1/Total Time Taken)*int(Voltage*Current,x,0,Total Time Taken)
Equivalent Large Signal Junction Capacitance
​ Go Equivalent Large Signal Junction Capacitance = Perimeter of Sidewall*Sidewall Junction Capacitance*Sidewall Voltage Equivalence Factor
Work Function in MOSFET
​ Go Work Function = Vaccum Level+(Conduction Band Energy Level-Fermi Level)
Zero Bias Sidewall Junction Capacitance per Unit Length
​ Go Sidewall Junction Capacitance = Zero Bias Sidewall Junction Potential*Depth of Sidewall

Sidewall Voltage Equivalence Factor Formula

Sidewall Voltage Equivalence Factor = -(2*sqrt(Built in Potential of Sidewall Junctions)/(Final Voltage-Initial Voltage)*(sqrt(Built in Potential of Sidewall Junctions-Final Voltage)-sqrt(Built in Potential of Sidewall Junctions-Initial Voltage)))
Keq(sw) = -(2*sqrt(Φosw)/(V2-V1)*(sqrt(Φosw-V2)-sqrt(Φosw-V1)))

How do sidewalls influence MOSFET behavior?

Sidewalls in MOSFETs can affect device characteristics, such as threshold voltage and subthreshold swing. Understanding sidewall properties is crucial for advanced transistor designs, including FinFETs and nanowire transistors.

How to Calculate Sidewall Voltage Equivalence Factor?

Sidewall Voltage Equivalence Factor calculator uses Sidewall Voltage Equivalence Factor = -(2*sqrt(Built in Potential of Sidewall Junctions)/(Final Voltage-Initial Voltage)*(sqrt(Built in Potential of Sidewall Junctions-Final Voltage)-sqrt(Built in Potential of Sidewall Junctions-Initial Voltage))) to calculate the Sidewall Voltage Equivalence Factor, The Sidewall Voltage Equivalence Factor formula is defined as a parameter used in modeling the corner effects of the gate oxide thickness in Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) devices. Sidewall Voltage Equivalence Factor is denoted by Keq(sw) symbol.

How to calculate Sidewall Voltage Equivalence Factor using this online calculator? To use this online calculator for Sidewall Voltage Equivalence Factor, enter Built in Potential of Sidewall Junctions osw), Final Voltage (V2) & Initial Voltage (V1) and hit the calculate button. Here is how the Sidewall Voltage Equivalence Factor calculation can be explained with given input values -> 1.00009 = -(2*sqrt(3.2E-05)/(6.135E-09-5.42E-09)*(sqrt(3.2E-05-6.135E-09)-sqrt(3.2E-05-5.42E-09))).

FAQ

What is Sidewall Voltage Equivalence Factor?
The Sidewall Voltage Equivalence Factor formula is defined as a parameter used in modeling the corner effects of the gate oxide thickness in Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) devices and is represented as Keq(sw) = -(2*sqrt(Φosw)/(V2-V1)*(sqrt(Φosw-V2)-sqrt(Φosw-V1))) or Sidewall Voltage Equivalence Factor = -(2*sqrt(Built in Potential of Sidewall Junctions)/(Final Voltage-Initial Voltage)*(sqrt(Built in Potential of Sidewall Junctions-Final Voltage)-sqrt(Built in Potential of Sidewall Junctions-Initial Voltage))). Built in Potential of Sidewall Junctions refers to the junction formed along the vertical or sidewall surfaces of the transistor structure, Final Voltage refers to the voltage level achieved or measured at the conclusion of a particular process or event & Initial Voltage refer to the voltage present at a specific point in a circuit at the beginning of a certain operation or under specific conditions.
How to calculate Sidewall Voltage Equivalence Factor?
The Sidewall Voltage Equivalence Factor formula is defined as a parameter used in modeling the corner effects of the gate oxide thickness in Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) devices is calculated using Sidewall Voltage Equivalence Factor = -(2*sqrt(Built in Potential of Sidewall Junctions)/(Final Voltage-Initial Voltage)*(sqrt(Built in Potential of Sidewall Junctions-Final Voltage)-sqrt(Built in Potential of Sidewall Junctions-Initial Voltage))). To calculate Sidewall Voltage Equivalence Factor, you need Built in Potential of Sidewall Junctions osw), Final Voltage (V2) & Initial Voltage (V1). With our tool, you need to enter the respective value for Built in Potential of Sidewall Junctions, Final Voltage & Initial Voltage and hit the calculate button. You can also select the units (if any) for Input(s) and the Output as well.
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